OptraSCAN®, the leading end-to-end digital pathology solution provider, announced its digital pathology scanner OS-SiA has been granted US patent – No 2020/0334814 A1 by the United States Patent and Trademark Office. OS-SiA has inbuilt intelligence to scan, index and analyze pathological samples simultaneously. This will benefit the end-user to view the whole slide scanned image along with analyzed output as an overlay during their review process.
The patent describes a technique invented by OptraSCAN, the AI-enabled digital pathology scanner OS-SiA automatically identifies specimens to scan and simultaneously analyses the tissue or cell area being scanned. OS-SiA is the industry’s first AI-enabled digital scanner that will provide real-time predictive analysis and actionable insights.
“Currently, the digital pathology slide scanners are restricted to partial or whole slide image acquisition and digitization into an image. Our next-generation scanner OS-SiA scans and analyses simultaneously eliminating the need for additional processing applications,” said Abhi Gholap, Founder & CEO, OptraSCAN. “This patent highlights our constant efforts to improve the adoption of digital pathology solutions and support the pathology community.”